Synchrotron X-ray Microtomography with Improved Image Quality by Ring Artifacts Correction for Structural Analysis of

Shengkun Yao1, Yunbing Zong2, Jiadong Fan1

  • 1School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, China.

Summary

This study introduces a novel method to eliminate ring artifacts in synchrotron X-ray microtomography. The technique enhances image quality for microstructure analysis, as demonstrated with Tenebrio molitor samples.