Metrological Suitability of Functionalized Epitaxial Graphene

Albert F Rigosi1, Mattias Kruskopf1,2,3, Alireza R Panna1

  • 1National Institute of Standards and Technology, 100 Bureau Drive, Stop 8171, Gaithersburg, MD, 20899, USA.

IEEE Transactions on Instrumentation and Measurement
|December 18, 2020
PubMed
Abstract

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