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Composition Analysis by STEM-EDX of Ternary Semiconductors by Internal References

Julie Stene Nilsen1, Antonius T J van Helvoort1

  • 1Department of Physics, Norwegian University of Science and Technology (NTNU)NO-7491, Trondheim, Norway.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|February 18, 2022
PubMed

Keywords:
EDXabsorptioncompound semiconductorsquantification

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