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David J Larson

Showing results (1-10 of 16) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 7, 2017
Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe TomographyTy J Prosa, David J Larson
Zookeys|November 29, 2019
<i>Scolopostethus affinis</i> (Schilling) (Hemiptera, Heteroptera, Rhyparochromidae, Drymini): a new alien established in North AmericaDavid J Larson, Geoffrey G E Scudder
Zookeys|September 3, 2016
Twelve new species and fifty-three new provincial distribution records of Aleocharinae rove beetles of Saskatchewan, Canada (Coleoptera, Staphylinidae)Jan Klimaszewski, David J Larson, Myriam Labrecque, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 23, 2016
Implementing Transmission Electron Backscatter Diffraction for Atom Probe TomographyKatherine P Rice, Yimeng Chen, Ty J Prosa, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 13, 2012
On the use of simulated field-evaporated specimen apex shapes in atom probe tomography data reconstructionDavid J Larson, Brian P Geiser, Ty J Prosa, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 6, 2018
A Study of Parameters Affecting Atom Probe Tomography Specimen SurvivabilityTy J Prosa, Savanna Strennen, David Olson, et al.
Science (New York, N.Y.)|September 8, 2007
Imaging of arsenic Cottrell atmospheres around silicon defects by three-dimensional atom probe tomographyKeith Thompson, Philip L Flaitz, Paul Ronsheim, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 16, 2007
Review of atom probe FIB-based specimen preparation methodsMichael K Miller, Kaye F Russell, Keith Thompson, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 16, 2007
Spatial distribution maps for atom probe tomographyBrian P Geiser, Thomas F Kelly, David J Larson, et al.
Ultramicroscopy|January 9, 2013
Electrostatic simulations of a local electrode atom probe: the dependence of tomographic reconstruction parameters on specimen and microscope geometryShyeh Tjing Loi, Baptiste Gault, Simon P Ringer, et al.
Pageof 2

Showing results (1-10 of 16) with videos related to

Sort By:
Pageof 2
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 7, 2017
Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe TomographyTy J Prosa, David J Larson
Zookeys|November 29, 2019
<i>Scolopostethus affinis</i> (Schilling) (Hemiptera, Heteroptera, Rhyparochromidae, Drymini): a new alien established in North AmericaDavid J Larson, Geoffrey G E Scudder
Zookeys|September 3, 2016
Twelve new species and fifty-three new provincial distribution records of Aleocharinae rove beetles of Saskatchewan, Canada (Coleoptera, Staphylinidae)Jan Klimaszewski, David J Larson, Myriam Labrecque, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 23, 2016
Implementing Transmission Electron Backscatter Diffraction for Atom Probe TomographyKatherine P Rice, Yimeng Chen, Ty J Prosa, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 13, 2012
On the use of simulated field-evaporated specimen apex shapes in atom probe tomography data reconstructionDavid J Larson, Brian P Geiser, Ty J Prosa, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 6, 2018
A Study of Parameters Affecting Atom Probe Tomography Specimen SurvivabilityTy J Prosa, Savanna Strennen, David Olson, et al.
Science (New York, N.Y.)|September 8, 2007
Imaging of arsenic Cottrell atmospheres around silicon defects by three-dimensional atom probe tomographyKeith Thompson, Philip L Flaitz, Paul Ronsheim, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 16, 2007
Review of atom probe FIB-based specimen preparation methodsMichael K Miller, Kaye F Russell, Keith Thompson, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 16, 2007
Spatial distribution maps for atom probe tomographyBrian P Geiser, Thomas F Kelly, David J Larson, et al.
Ultramicroscopy|January 9, 2013
Electrostatic simulations of a local electrode atom probe: the dependence of tomographic reconstruction parameters on specimen and microscope geometryShyeh Tjing Loi, Baptiste Gault, Simon P Ringer, et al.
Pageof 2