Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

F Bijkerk

Showing results (21-30 of 34) with videos related to

Pageof 4
Sort By:
Optics Express|October 17, 2014
Combined EUV reflectance and X-ray reflectivity data analysis of periodic multilayer structuresS N Yakunin, I A Makhotkin, K V Nikolaev, et al.
Acta Crystallographica. Section A, Foundations and Advances|September 6, 2018
Specular reflection intensity modulated by grazing-incidence diffraction in a wide angular rangeK V Nikolaev, I A Makhotkin, S N Yakunin, et al.
Optics Letters|April 3, 2012
Infrared antireflective filtering for extreme ultraviolet multilayer Bragg reflectorsV V Medvedev, A E Yakshin, R W E van de Kruijs, et al.
Optics Letters|September 3, 2011
Infrared suppression by hybrid EUV multilayer--IR etalon structuresV V Medvedev, A E Yakshin, R W E van de Kruijs, et al.
Optics Express|August 14, 2013
Infrared diffractive filtering for extreme ultraviolet multilayer Bragg reflectorsV V Medvedev, A J R van den Boogaard, R van der Meer, et al.
Physical Chemistry Chemical Physics : PCCP|February 3, 2017
Determining crystal phase purity in c-BP through X-ray absorption spectroscopyS P Huber, V V Medvedev, E Gullikson, et al.
Optics Express|March 10, 2018
Narrowband and tunable anomalous transmission filters for spectral monitoring in the extreme ultraviolet wavelength regionJ L P Barreaux, I V Kozhevnikov, M Bayraktar, et al.
Journal of Synchrotron Radiation|March 11, 2020
A semi-analytical approach for the characterization of ordered 3D nanostructures using grazing-incidence X-ray fluorescenceK V Nikolaev, V Soltwisch, P Hönicke, et al.
Optics Letters|March 19, 2008
Spectral-purity-enhancing layer for multilayer mirrorsM M J W van Herpen, R W E van de Kruijs, D J W Klunder, et al.
Optics Letters|September 3, 2011
Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurementsR A Loch, A Dubrouil, R Sobierajski, et al.
Pageof 4

Showing results (21-30 of 34) with videos related to

Sort By:
Pageof 4
Optics Express|October 17, 2014
Combined EUV reflectance and X-ray reflectivity data analysis of periodic multilayer structuresS N Yakunin, I A Makhotkin, K V Nikolaev, et al.
Acta Crystallographica. Section A, Foundations and Advances|September 6, 2018
Specular reflection intensity modulated by grazing-incidence diffraction in a wide angular rangeK V Nikolaev, I A Makhotkin, S N Yakunin, et al.
Optics Letters|April 3, 2012
Infrared antireflective filtering for extreme ultraviolet multilayer Bragg reflectorsV V Medvedev, A E Yakshin, R W E van de Kruijs, et al.
Optics Letters|September 3, 2011
Infrared suppression by hybrid EUV multilayer--IR etalon structuresV V Medvedev, A E Yakshin, R W E van de Kruijs, et al.
Optics Express|August 14, 2013
Infrared diffractive filtering for extreme ultraviolet multilayer Bragg reflectorsV V Medvedev, A J R van den Boogaard, R van der Meer, et al.
Physical Chemistry Chemical Physics : PCCP|February 3, 2017
Determining crystal phase purity in c-BP through X-ray absorption spectroscopyS P Huber, V V Medvedev, E Gullikson, et al.
Optics Express|March 10, 2018
Narrowband and tunable anomalous transmission filters for spectral monitoring in the extreme ultraviolet wavelength regionJ L P Barreaux, I V Kozhevnikov, M Bayraktar, et al.
Journal of Synchrotron Radiation|March 11, 2020
A semi-analytical approach for the characterization of ordered 3D nanostructures using grazing-incidence X-ray fluorescenceK V Nikolaev, V Soltwisch, P Hönicke, et al.
Optics Letters|March 19, 2008
Spectral-purity-enhancing layer for multilayer mirrorsM M J W van Herpen, R W E van de Kruijs, D J W Klunder, et al.
Optics Letters|September 3, 2011
Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurementsR A Loch, A Dubrouil, R Sobierajski, et al.
Pageof 4