Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Huolin L Xin
David A Muller

Showing results (1-10 of 400) with videos related to

Pageof 40
Sort By:
Nature Nanotechnology|November 5, 2010
Electron microscopy: a new spin on electron beamsHuolin L Xin, David A Muller
Journal of Electron Microscopy|January 24, 2009
Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEMHuolin L Xin, David A Muller
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 23, 2010
Three-dimensional imaging in aberration-corrected electron microscopesHuolin L Xin, David A Muller
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 3, 2010
Extended depth of field for high-resolution scanning transmission electron microscopyRobert Hovden, Huolin L Xin, David A Muller
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2012
Determining on-axis crystal thickness with quantitative position-averaged incoherent bright-field signal in an aberration-corrected STEMHuolin L Xin, Ye Zhu, David A Muller
Ultramicroscopy|August 2, 2008
Analytic derivation of optimal imaging conditions for incoherent imaging in aberration-corrected electron microscopesVarat Intaraprasonk, Huolin L Xin, David A Muller
Ultramicroscopy|February 25, 2014
Is there a Stobbs factor in atomic-resolution STEM-EELS mapping?Huolin L Xin, Christian Dwyer, David A Muller
Science (New York, N.Y.)|December 8, 2009
Visualizing the 3D internal structure of calcite single crystals grown in agarose hydrogelsHanying Li, Huolin L Xin, David A Muller, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 23, 2013
Scanning confocal electron energy-loss microscopy using valence-loss signalsHuolin L Xin, Christian Dwyer, David A Muller, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 16, 2012
Data processing for atomic resolution electron energy loss spectroscopyPaul Cueva, Robert Hovden, Julia A Mundy, et al.
Pageof 40

Showing results (1-10 of 400) with videos related to

Sort By:
Pageof 40
Nature Nanotechnology|November 5, 2010
Electron microscopy: a new spin on electron beamsHuolin L Xin, David A Muller
Journal of Electron Microscopy|January 24, 2009
Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEMHuolin L Xin, David A Muller
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 23, 2010
Three-dimensional imaging in aberration-corrected electron microscopesHuolin L Xin, David A Muller
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 3, 2010
Extended depth of field for high-resolution scanning transmission electron microscopyRobert Hovden, Huolin L Xin, David A Muller
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2012
Determining on-axis crystal thickness with quantitative position-averaged incoherent bright-field signal in an aberration-corrected STEMHuolin L Xin, Ye Zhu, David A Muller
Ultramicroscopy|August 2, 2008
Analytic derivation of optimal imaging conditions for incoherent imaging in aberration-corrected electron microscopesVarat Intaraprasonk, Huolin L Xin, David A Muller
Ultramicroscopy|February 25, 2014
Is there a Stobbs factor in atomic-resolution STEM-EELS mapping?Huolin L Xin, Christian Dwyer, David A Muller
Science (New York, N.Y.)|December 8, 2009
Visualizing the 3D internal structure of calcite single crystals grown in agarose hydrogelsHanying Li, Huolin L Xin, David A Muller, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 23, 2013
Scanning confocal electron energy-loss microscopy using valence-loss signalsHuolin L Xin, Christian Dwyer, David A Muller, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 16, 2012
Data processing for atomic resolution electron energy loss spectroscopyPaul Cueva, Robert Hovden, Julia A Mundy, et al.
Pageof 40