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V I Gushenets

Showing results (1-10 of 17) with videos related to

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The Review of Scientific Instruments|July 24, 2024
High intensity proton source based on a hollow-cathode reflex dischargeV I Gushenets, A S Bugaev, E M Oks
The Review of Scientific Instruments|March 5, 2008
Side extraction duoPIGatron-type ion sourceV I Gushenets, E M Oks, Ady Hershcovitch, et al.
The Review of Scientific Instruments|August 22, 2025
Transport of a high-intensity pulsed proton beam through a space-charge plasma lensV I Gushenets, A S Bugaev, V P Frolova, et al.
The Review of Scientific Instruments|March 3, 2012
Molecular phosphorus ion source for semiconductor technologyV I Gushenets, A S Bugaev, E M Oks, et al.
The Review of Scientific Instruments|March 6, 2014
Gas feeding molecular phosphorous ion source for semiconductor implantersV I Gushenets, E M Oks, A S Bugaev, et al.
The Review of Scientific Instruments|March 3, 2010
Self-heated hollow cathode discharge system for charged particle sources and plasma generatorsV I Gushenets, A S Bugaev, E M Oks, et al.
The Review of Scientific Instruments|March 5, 2008
Experimental comparison of time-of-flight mass analysis with magnetic mass analysisV I Gushenets, A S Bugaev, E M Oks, et al.
The Review of Scientific Instruments|March 3, 2012
Electrostatic plasma lens for focusing negatively charged particle beamsA A Goncharov, A M Dobrovolskiy, S M Dunets, et al.
The Review of Scientific Instruments|March 6, 2014
Inverted time-of-flight spectrometer for mass-to-charge analysis of plasmaV I Gushenets, Yu A Burachevsky, A V Vizir, et al.
The Review of Scientific Instruments|March 3, 2012
High-energy metal ion implantation for reduction of surface resistivity of alumina ceramicV I Gushenets, A G Nikolaev, E M Oks, et al.
Pageof 2

Showing results (1-10 of 17) with videos related to

Sort By:
Pageof 2
The Review of Scientific Instruments|July 24, 2024
High intensity proton source based on a hollow-cathode reflex dischargeV I Gushenets, A S Bugaev, E M Oks
The Review of Scientific Instruments|March 5, 2008
Side extraction duoPIGatron-type ion sourceV I Gushenets, E M Oks, Ady Hershcovitch, et al.
The Review of Scientific Instruments|August 22, 2025
Transport of a high-intensity pulsed proton beam through a space-charge plasma lensV I Gushenets, A S Bugaev, V P Frolova, et al.
The Review of Scientific Instruments|March 3, 2012
Molecular phosphorus ion source for semiconductor technologyV I Gushenets, A S Bugaev, E M Oks, et al.
The Review of Scientific Instruments|March 6, 2014
Gas feeding molecular phosphorous ion source for semiconductor implantersV I Gushenets, E M Oks, A S Bugaev, et al.
The Review of Scientific Instruments|March 3, 2010
Self-heated hollow cathode discharge system for charged particle sources and plasma generatorsV I Gushenets, A S Bugaev, E M Oks, et al.
The Review of Scientific Instruments|March 5, 2008
Experimental comparison of time-of-flight mass analysis with magnetic mass analysisV I Gushenets, A S Bugaev, E M Oks, et al.
The Review of Scientific Instruments|March 3, 2012
Electrostatic plasma lens for focusing negatively charged particle beamsA A Goncharov, A M Dobrovolskiy, S M Dunets, et al.
The Review of Scientific Instruments|March 6, 2014
Inverted time-of-flight spectrometer for mass-to-charge analysis of plasmaV I Gushenets, Yu A Burachevsky, A V Vizir, et al.
The Review of Scientific Instruments|March 3, 2012
High-energy metal ion implantation for reduction of surface resistivity of alumina ceramicV I Gushenets, A G Nikolaev, E M Oks, et al.
Pageof 2