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Ultramicroscopy|July 23, 2003
Aberration correction results in the IBM STEM instrumentP E Batson
Ultramicroscopy|July 23, 2003
Imaging individual atoms inside crystals with ADF-STEMP M Voyles, J L Grazul, D A Muller
Ultramicroscopy|July 23, 2003
Channelling effects in atomic resolution STEMC J Rossouw, L J Allen, S D Findlay, et al.
Ultramicroscopy|March 30, 2004
Resolution extension and exit wave reconstruction in complex HREMWen-Kuo Hsieh, Fu-Rong Chen, Ji-Jung Kai, et al.
Ultramicroscopy|October 1, 1992
Automated microscopy for electron tomographyA J Koster, H Chen, J W Sedat, et al.
Ultramicroscopy|October 1, 1992
Has negative staining still a place in biomacromolecular electron microscopy?A Bremer, C Henn, A Engel, et al.
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