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Ultramicroscopy|October 1, 2016
The development of the spatially correlated adjustment wavelet filter for atomic force microscopy dataAndrzej Sikora, Aleksander Rodak, Olgierd Unold, et al.Ultramicroscopy|October 1, 2016
Dependence of the volume of an antibody on the force applied in a force microscopy experiment in liquidJorge Rodriguez-Ramos, Alma P Perrino, Ricardo GarciaUltramicroscopy|February 7, 2017
Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformationsD Schryvers, E K H Salje, M Nishida, et al.Ultramicroscopy|February 4, 2017
Measuring thermal conductivity of thin films by Scanning Thermal Microscopy combined with thermal spreading resistance analysisJ Juszczyk, A Kaźmierczak-Bałata, P Firek, et al.Ultramicroscopy|January 23, 2017
Tensor decompositions for the analysis of atomic resolution electron energy loss spectraJakob Spiegelberg, Ján Rusz, Kristiaan PelckmansUltramicroscopy|February 14, 2017
Fluctuation microscopy analysis of amorphous silicon modelsJ M Gibson, M M J TreacyUltramicroscopy|April 8, 2017
Twenty years after: How "Aberration correction in the STEM" truly placed a "A synchrotron in a Microscope"Quentin M RamasseUltramicroscopy|July 23, 2003
Imaging individual atoms inside crystals with ADF-STEMP M Voyles, J L Grazul, D A MullerUltramicroscopy|July 23, 2003
Channelling effects in atomic resolution STEMC J Rossouw, L J Allen, S D Findlay, et al.Pageof 460