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Ultramicroscopy|November 3, 2017
Material interface detection based on secondary electron images for focused ion beam machiningHang-Eun Joe, Won-Sup Lee, Martin B G Jun, et al.Ultramicroscopy|July 6, 2014
Advanced double-biprism holography with atomic resolutionFlorian Genz, Tore Niermann, Bart Buijsse, et al.Ultramicroscopy|May 8, 2016
Image transfer with spatial coherence for aberration corrected transmission electron microscopesFumio Hosokawa, Hidetaka Sawada, Takao Shinkawa, et al.Ultramicroscopy|April 1, 1989
A corrected double-deflection electron spectrometer equipped with a parallel recording systemM HaiderUltramicroscopy|October 30, 2020
Autofocus of whole slide imaging based on convolution and recurrent neural networksYao Xiang, Zhujun He, Qing Liu, et al.Ultramicroscopy|October 30, 2020
Effect of native oxide on the crystal orientation contrast in SEM micrographs obtained at hundreds, tens and units of eVŠárka Mikmeková, Tomohiro AoyamaUltramicroscopy|June 8, 2021
A multi-ion plasma FIB study: Determining ion implantation depths of Xe, N, O and Ar in tungsten via atom probe tomographyKatja Eder, Vijay Bhatia, Jiangtao Qu, et al.Ultramicroscopy|May 28, 2021
Correction of artefacts associated with large area EBSDB Winiarski, A Gholinia, K Mingard, et al.Ultramicroscopy|March 17, 2022
Multi-exposure microscopic image fusion-based detail enhancement algorithmHarbinder Singh, Gabriel Cristobal, Gloria Bueno, et al.Ultramicroscopy|October 19, 2019
Towards large scale orientation mapping using the eCHORD methodC Lafond, T Douillard, S Cazottes, et al.Pageof 460