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Ultramicroscopy|January 22, 2026
Towards large-area EELS mapping of precipitates in a steel matrix: Comparing low loss and high loss quantificationAlan J Craven, Bianca Sala, Ian MacLarenUltramicroscopy|December 19, 2025
Energy-resolved EBSD using a monolithic direct electron detectorNicolò M Della Ventura, Kalani Moore, McLean P Echlin, et al.Ultramicroscopy|November 8, 2025
An electrostatic aberration corrector for improved Low-Voltage SEM imagingDiederik Jan MaasUltramicroscopy|June 26, 2025
Transmission electron microscope with a mirror objective free of spherical and axial chromatic aberrationsS B Bimurzaev, Z S SautbekovaUltramicroscopy|June 24, 2025
Can low energy (1-20 eV) electron microscopy produce damage-free images of biological samples?Yi Zheng, Léon SancheUltramicroscopy|September 25, 2025
Evaluating atomic counts in metal nanoclusters via scanning transmission electron microscopyKeizo Tsukamoto, Naoyuki Hirata, Masahide Tona, et al.Ultramicroscopy|July 12, 2025
High-energy resolution monochromated STEM-EELS mapping across large areasCaleb Whittier, Nabil D BassimUltramicroscopy|July 12, 2025
Orientation-adaptive virtual imaging of defects using EBSDNicolò M Della Ventura, James D Lamb, William C Lenthe, et al.Ultramicroscopy|July 20, 2025
Cryogenic sample preparation: Comparative analysis of Ga+ and Xe+ FIB milling for TEM and APT examination of zirconiumÖmer Koç, Benjamin M Jenkins, Jack Haley, et al.Ultramicroscopy|May 6, 2025
Robust projection parameter calibration in cryo-ET with L1-norm optimizationShengkai Guo, Zihe Xu, Xinyan Li, et al.Pageof 460