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Ultramicroscopy|September 25, 2025
Evaluating atomic counts in metal nanoclusters via scanning transmission electron microscopyKeizo Tsukamoto, Naoyuki Hirata, Masahide Tona, et al.
Ultramicroscopy|July 12, 2025
High-energy resolution monochromated STEM-EELS mapping across large areasCaleb Whittier, Nabil D Bassim
Ultramicroscopy|July 12, 2025
Orientation-adaptive virtual imaging of defects using EBSDNicolò M Della Ventura, James D Lamb, William C Lenthe, et al.
Ultramicroscopy|July 20, 2025
Cryogenic sample preparation: Comparative analysis of Ga+ and Xe+ FIB milling for TEM and APT examination of zirconiumÖmer Koç, Benjamin M Jenkins, Jack Haley, et al.
Ultramicroscopy|May 6, 2025
Robust projection parameter calibration in cryo-ET with L1-norm optimizationShengkai Guo, Zihe Xu, Xinyan Li, et al.
Ultramicroscopy|May 9, 2025
High-precision atomic imaging using an innovative vibration-isolated scanning tunneling microscopeBehnam Esmaeilzadeh, Muhammad Touqeer, Syed Asad Maqbool, et al.
Ultramicroscopy|October 20, 2025
Simulation study of the performance of neural network-enhanced PACBED for characterizing atomic-scale deformations in 2D van der Waals materialsAndrew B Yankovich, Magnus Röding, Eva Olsson
Ultramicroscopy|October 1, 2025
Growth and oxidation of ultra-thin Pt-Sn layers on Pt(111) by molecular and atomic oxygenN Braud, L Buß, L Merte, et al.
Ultramicroscopy|August 15, 2025
Breakdown and polarization contrasts in ferroelectric devices observed by operando laser-based photoemission electron microscopy with the AC/DC electrical characterization systemHirokazu Fujiwara, Yuki Itoya, Masaharu Kobayashi, et al.
Ultramicroscopy|February 10, 2026
Room-temperature focused ion beam preparation of sensitive organic-inorganic hybrid perovskitesYu Chen, Yuan Lu, Xiangchen Hu, et al.
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