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Ultramicroscopy|February 22, 2011
Chemical mapping of a block copolymer electrolyte by low-loss EFTEM spectrum-imaging and principal component analysisF I Allen, M Watanabe, Z Lee, et al.
Ultramicroscopy|February 22, 2011
Point defect characterization in HAADF-STEM images using multivariate statistical analysisMichael C Sarahan, Miaofang Chi, Daniel J Masiel, et al.
Ultramicroscopy|March 15, 2011
Analysis of EEL spectrum of low-loss region using the C(s)-corrected STEM-EELS method and multivariate analysisTakashi Yamazaki, Yasutoshi Kotaka, Yuji Kataoka
Ultramicroscopy|March 10, 2021
Analysis and improvement of positioning reliability and accuracy of theta pipette configuration for scanning ion conductance microscopyYangbohan Jiao, Jian Zhuang, Fei Li, et al.
Ultramicroscopy|October 27, 2018
Corrigendum to: "Theory of the spatial resolution of (scanning) transmission electron microscopy in liquid water or ice layers" [Ultramicroscopy 187 (2018) 113-125]Niels de Jonge
Ultramicroscopy|July 17, 2019
Localized surface curvature artifacts in tip-enhanced nanospectroscopy imagingE Sheremet, L Kim, D Stepanichsheva, et al.
Ultramicroscopy|July 14, 2019
Carrier profiling with fast Fourier transform scanning spreading resistance microscopy: A case study for Ge, GaAs, InGaAs, and InPOberon Dixon-Luinenburg, Umberto Celano, Wilfried Vandervorst, et al.
Ultramicroscopy|August 16, 2014
Theory of dynamical electron channeling contrast images of near-surface crystal defectsY N Picard, M Liu, J Lammatao, et al.
Ultramicroscopy|August 16, 2014
Effect of surface stress on microcantilever resonance frequency during water adsorption: influence of microcantilever dimensionsK Lakshmoji, K Prabakar, S Tripura Sundari, et al.
Ultramicroscopy|August 17, 2014
Enhanced contrast separation in scanning electron microscopes via a suspended-thin sample approachYuan Ji, Li Wang, Zhenxi Guo, et al.
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