A self-timed multipurpose delay sensor for Field Programmable Gate Arrays (FPGAs).

Area of Science:

• Electrical Engineering
• Computer Engineering
• Integrated Circuit Design

Background:

• Field Programmable Gate Arrays (FPGAs) are widely used in digital systems, but their performance can vary due to factors like process variability, temperature, and critical path timing.
• Monitoring these performance variations throughout the device lifecycle is crucial for ensuring reliability and optimizing operation.
• Existing methods for performance monitoring may require complex clock distribution networks or are limited by system clock frequencies.

Purpose of the Study:

• To present a novel self-timed, multi-purpose sensor specifically designed for FPGAs.
• To enable accurate measurement of performance variations, including process variability, critical path timing, and temperature.
• To offer a simplified design approach for integrating sensor networks with FPGA application logic.

Main Methods:

• A novel topology utilizing combinational and sequential FPGA elements to amplify signal delay.
• The sensor amplifies the time of a signal traversing a delay chain, producing a pulse whose width represents the measurement.
• The sensor is fully self-timed, eliminating the need for external clock distribution networks.

Main Results:

• The proposed sensor successfully measures performance variations within FPGAs.
• When used as a temperature sensor, it demonstrated a low error of ±0.67 °C over a 20-100 °C range.
• The sensor design utilizes a minimal number of logic elements (20) and requires only a 2-point calibration.

Conclusions:

• The developed self-timed multi-purpose sensor offers a simplified and effective solution for monitoring FPGA performance.
• Its self-timed nature and minimal resource utilization make it an attractive option for designers.
• The sensor's accuracy and versatility open possibilities for enhanced FPGA reliability and adaptive computing.