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McLean P Echlin

Showing results (1-10 of 10) with videos related to

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The Review of Scientific Instruments|March 3, 2012
A new TriBeam system for three-dimensional multimodal materials analysisMcLean P Echlin, Alessandro Mottura, Christopher J Torbet, et al.
Advanced Materials (Deerfield Beach, Fla.)|May 25, 2011
A new femtosecond laser-based tomography technique for multiphase materialsMcLean P Echlin, Naji S Husseini, John A Nees, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 9, 2017
Reconstruction of Laser-Induced Surface Topography from Electron Backscatter Diffraction PatternsPatrick G Callahan, McLean P Echlin, Tresa M Pollock, et al.
Ultramicroscopy|September 15, 2018
Advanced detector signal acquisition and electron beam scanning for high resolution SEM imagingWilliam C Lenthe, Jean Charles Stinville, McLean P Echlin, et al.
Ultramicroscopy|December 19, 2025
Energy-resolved EBSD using a monolithic direct electron detectorNicolò M Della Ventura, Kalani Moore, McLean P Echlin, et al.
Ultramicroscopy|December 22, 2017
Transmission scanning electron microscopy: Defect observations and image simulationsPatrick G Callahan, Jean-Charles Stinville, Eric R Yao, et al.
Ultramicroscopy|November 16, 2020
Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisitionFulin Wang, McLean P Echlin, Aidan A Taylor, et al.
Ultramicroscopy|November 27, 2024
Direct electron detection for EBSD of low symmetry & beam sensitive ceramicsNicolò M Della Ventura, Andrew R Ericks, McLean P Echlin, et al.
Optics Express|March 1, 2017
Electrically pumped continuous wave quantum dot lasers epitaxially grown on patterned, on-axis (001) SiJustin Norman, M J Kennedy, Jennifer Selvidge, et al.
Ultramicroscopy|July 12, 2025
Orientation-adaptive virtual imaging of defects using EBSDNicolò M Della Ventura, James D Lamb, William C Lenthe, et al.
Pageof 1

Showing results (1-10 of 10) with videos related to

Sort By:
Pageof 1
The Review of Scientific Instruments|March 3, 2012
A new TriBeam system for three-dimensional multimodal materials analysisMcLean P Echlin, Alessandro Mottura, Christopher J Torbet, et al.
Advanced Materials (Deerfield Beach, Fla.)|May 25, 2011
A new femtosecond laser-based tomography technique for multiphase materialsMcLean P Echlin, Naji S Husseini, John A Nees, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 9, 2017
Reconstruction of Laser-Induced Surface Topography from Electron Backscatter Diffraction PatternsPatrick G Callahan, McLean P Echlin, Tresa M Pollock, et al.
Ultramicroscopy|September 15, 2018
Advanced detector signal acquisition and electron beam scanning for high resolution SEM imagingWilliam C Lenthe, Jean Charles Stinville, McLean P Echlin, et al.
Ultramicroscopy|December 19, 2025
Energy-resolved EBSD using a monolithic direct electron detectorNicolò M Della Ventura, Kalani Moore, McLean P Echlin, et al.
Ultramicroscopy|December 22, 2017
Transmission scanning electron microscopy: Defect observations and image simulationsPatrick G Callahan, Jean-Charles Stinville, Eric R Yao, et al.
Ultramicroscopy|November 16, 2020
Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisitionFulin Wang, McLean P Echlin, Aidan A Taylor, et al.
Ultramicroscopy|November 27, 2024
Direct electron detection for EBSD of low symmetry & beam sensitive ceramicsNicolò M Della Ventura, Andrew R Ericks, McLean P Echlin, et al.
Optics Express|March 1, 2017
Electrically pumped continuous wave quantum dot lasers epitaxially grown on patterned, on-axis (001) SiJustin Norman, M J Kennedy, Jennifer Selvidge, et al.
Ultramicroscopy|July 12, 2025
Orientation-adaptive virtual imaging of defects using EBSDNicolò M Della Ventura, James D Lamb, William C Lenthe, et al.
Pageof 1